Products
J-STD-075 picks up where J-STD-020 left off by providing test methods to classify worst-case thermal process limitations for electronic components. Classification is referenced to common industry wave and reflow solder profiles including lead-free processing. The classifications represent maximum process sensitivity levels and do not establish rework conditions or recommended processes for an...
El J-STD-075 continúa donde es J-STD-020 termina proporcionando los métodos de pruebas para clasificar las limitaciones de los procesos térmicos en los peores casos para los componentes electrónicos. Las clasificación hace referencia a los perfiles de soldadura para procesos industriales comunes de ola y de reflujo incluyendo procesos libres de plomo. La clasificación representa los máximos...
简要介绍 (英文) J-STD-075主要涵盖了J-STD-020未涉及的内容,所提供的测试方法可针对电子元器件在最坏情况下对焊接组装工艺的限制进行分级,分级时采用常见的波峰焊和再流焊工艺曲线,包括无铅工艺。分级代表最高的工艺敏感等级,并没有为组装厂建立返工条件或推荐工艺。它概述了非半导体元器件工艺敏感等级(PSL)的分级和标识程序,潮湿敏感等级(MSL)符合半导体行业的分级(J-STD-020《非气密固态表面贴装器件潮湿/再流焊敏感度分级》和J-STD-033《潮湿/再流焊敏感表面贴装器件的操作、包装、运输及使用》)。J-STD-075取代IPC-9503。由ECA、IPC和JEDEC联合开发。全文共12页,于2008年8月发布。2010年9月出版其中文版。
This is the German Language version of the J-STD-075. J-STD-075 picks up where J-STD-020 left off by providing test methods to classify worst-case thermal process limitations for electronic components. Classification is referenced to common industry wave and reflow solder profiles including lead-free processing. The classifications represent maximum process sensitivity levels and do not establish...
Coming Soon
IPC-7095E: Design and Assembly Process Implementation for Ball Grid Arrays (BGAs)
IPC-7530B: Guidelines for Temperature Profiling for Mass Soldering Processes (Reflow & Wave)
IPC-2294: Design Standard for Printed Electronics on Rigid Substrates
IPC-6904: Qualification and Performance Specifications for Printed Electronics on Rigid Substrates
IPC-4105: Specification for Metal Base Copper Clad laminates for Rigid Printed Boards