Close

IPC/EIA-J-STD-028 Standard Only

Your results

  • 1

Language

Products

Document #:
Revision
Original Version
Product Type
Released:  08/01/1999
Language
English
Current Revision
This standard establishes construction detail requirements for bumps and other terminal structures used for Flip Chip Scale carriers. The specific standards for different terminations are appropriately matched to a particular interconnection process and include such diverse terminations as solder bumps, columns, non-melting stand-offs and conductive polymer deposits. The document articulates a set...