Current Revision
IPC/JEDEC-J-STD-035 - Revision A - Standard Only
Acoustic Microscopy for Nonhermetic Encapsulated Electronics Devices
IPC/JEDEC J-STD-035A test method defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic devices. IPC/JEDEC J-STD-035A method provides users with an acoustic microscopy process flow for detecting anomalies (delaminations, cracks, mold compound voids, etc.) nondestructively in encapsulated electronic devices while achieving reproducibility
Published Date
Pages
26
DoD Adopted
No
ANSI Approved
No
https://www.ipc.org/TOC/J-STD-035A_TOC.pdf